A.Azhagu Jaisudhan Pazhani

1 works

Ramco Institute of Technology,Department of Electronics & Communication Engineering,Rajapalayam,India

1. Reliability-Aware Clustering for IoT Device Layers based on Cold Standby Redundancy

   B Siva Lakshmi, Kakumanu Kranthikumar, M S Muneshwara +3

   ArticleIoT and Edge/Fog Computing20250 citations

   ABIABI:AkademIndex/openalex/2025.article.019348