Low-temperature yield stress anomaly in single-crystal silver
A. I. LandauPhysicotechnical Institute of Low Tempeatures, Ukrainian Academy of SciencesT. A. ParkhomenkoPhysicotechnical Institute of Low Tempeatures, Ukrainian Academy of SciencesV. V. PustovalovPhysicotechnical Institute of Low Tempeatures, Ukrainian Academy of Sciences
ABI
Abstract
Temperature dependence of the yield point τ0(T) was studied in single crystals of 99.9%-pure silver within the range 1.6–77.3 °K. An anomaly was discovered which consists of a maximum and minimum appearing on the curve for this dependence. A theoretical explanation is offered for the anomalous dependence τ0(T), based on the assumption of two types of restraint on the migration of dislocation in crystals: thermogenic restraint caused by thermal fluctuation and athermogenic hindrances which are intrinsic in crystals or arise through other mechanisms than thermal activation. A computer-assisted comparison of theoretically derived τ0(T) with the experimentally obtained dependence shows satisfactory agreement.
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