Article

Proximity effect in lead/copper contacts

V. M. SvistunovPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR, DonetskMikhail BelogolovskiiPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR, DonetskV. Yu. TarenkovPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR, DonetskN. D. TsapkoPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR, Donetsk

Soviet Journal of Low Temperature Physicsjournal1979en

ABI

Abstract

An anomalous behavior of the characteristics of tunnel junctions made with a thin superconducting lead film (∽250 Å) coated with a normal metal layer is reported.

Topics

Electrical Contact Performance and Analysis Semiconductor materials and interfaces Copper Interconnects and Reliability

Identifiers

DOI: 10.1063/10.0029968

Citations and references

Cited by 06 references

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