Article

Conduction-electron focusing by an inhomogeneous magnetic field

Yu. A. KolesnichenkoPhysicotechnical Institute of Low Temperature, Academy of Sciences of the Ukrainian SSR, Khar’kovV. G. Peschanskiı̆Physicotechnical Institute of Low Temperature, Academy of Sciences of the Ukrainian SSR, Khar’kov

Soviet Journal of Low Temperature Physicsjournal1980en

ABI

Abstract

It is shown that transverse focusing of electrons by an inhomogeneous magnetic field enables much more detailed information to be obtained about the interaction of charge carriers with the surface of the conductor than is provided by homogeneous focusing. In particular, the angular dependence of the specularity parameters qii can be completely reproduced. The position of the focusing lines bears information about the dynamic properties of the conduction electrons. An analysis is made of the role of the electric field in electron focusing in anisotropic conductors.

Topics

Electron and X-Ray Spectroscopy Techniques Advanced Electron Microscopy Techniques and Applications Copper Interconnects and Reliability

Identifiers

DOI: 10.1063/10.0030043

Citations and references

Cited by 04 references

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