Structure of condensed oxygen films
S. I. KovalenkoPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, KharkovA. A. SolodovnikPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Kharkov
ABI
Abstract
We have carried out electron diffraction studies of the structure of condensed O2 films at temperatures ranging from 5 K to 32–34 K using samples whose effective thicknesses ranged from 20–30 Å to 400 Å. Analysis of the resulting diffraction patterns established that there are stable film phases characteristic of bulk crystals. It is shown that the “anomalous” α′ phase is due to impurities in the oxygen rather than to a size effect. We have studied the conditions necessary for forming an amorphous phase and a high-temperature version of γ-O2 that is metastable over a specific temperature range.
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