Article

Features of the kinetics and a new mechanism for crystallization of obliquely deposited amorphous ytterbium films

V. M. Kuz’menkoPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR , KharkovB.G. LazarevPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR , KharkovV. I. Mel'NikovPhysicotechnical Institute, Academy of Sciences of the Ukrainian SSR , Kharkov

Soviet Journal of Low Temperature Physicsjournal1986en

ABI

Abstract

A hitherto unobserved mechanism for the formation of double-layered amorphous–crystalline films of ytterbium at liquid helium temperature has been found. It evidently arises from a lowering of the density of obliquely deposited layers, compared with those deposited normally. The same cause explains the features found in the kinetics of the crystallization of obliquely deposited amorphous ytterbium films; higher values of the activation energy and lower values for the front velocity for avalanche crystallization.

Topics

nanoparticles nucleation surface interactions Metallic Glasses and Amorphous Alloys Thermodynamic and Structural Properties of Metals and Alloys

Identifiers

DOI: 10.1063/10.0031544

Citations and references

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