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6 works

Work: Depth profiles of Sb atoms implanted into Ti

  1. THE STOPPING AND RANGE OF IONS IN SOLIDS

    J. F. Ziegler

    Chapter198815 citations
    ABI
  2. Silicides for VLSI applications

    S. P. Murarka

    Book19836 citations
    ABI
  3. Concepts of Backscattering Spectrometry

    Wei‐Kan Chu, James W. Mayer, Marc‐A. Nicolet

    Chapter19782 citations
    ABI
  4. Untitled

    Other1 citations
    ABI
  5. Untitled

    Other1 citations
    ABI
  6. Untitled

    Other1 citations
    ABI