Article

Electron-diffraction studies of solidified CO2-Xe mixtures

S. I. KovalenkoB. I. Berkin Physicotechnical Institute of Low Temperatures, Ukrainian Academy of Sciences, KharkovA. A. SolodovnikB. I. Berkin Physicotechnical Institute of Low Temperatures, Ukrainian Academy of Sciences, Kharkov

Low Temperature Physicsjournal1993en

ABI

Abstract

The structure of condensed CO2–Xe films is studied in the temperature range 6–60 K. Gaseous mixtures whose composition varied from 0 to 100% Xe were condensed on substrates at temperatures 55 and 6 K. It is found that up to 5 mol.% Xe is dissolved in the CO2 matrix during high-temperature deposition, while the dissolution of CO2 in Xe is below the sensitivity of the x-ray diffraction technique. The structure and substructure of low-temperature condensates are studied as well as the kinetics of relaxation processes stimulated by the annealing of these films.

Topics

Phase Equilibria and Thermodynamics nanoparticles nucleation surface interactions Inorganic Fluorides and Related Compounds

Identifiers

DOI: 10.1063/10.0033388

Citations and references

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