Article

X-ray monitoring of the filling of cluster lattices in synthetic opals

В. В. РатниковA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg

Technical Physics Lettersjournal1997en

ABI

Abstract

It is proposed that the filling of cluster lattices in synthetic opals can be monitored by measurements of the absorption of x-rays. It is demonstrated that the degree of filling of the pores in the opals depends on the method of incorporating In, Te, and HgSe.

Topics

Photonic Crystals and Applications Silicon Nanostructures and Photoluminescence Mineralogy and Gemology Studies

Identifiers

DOI: 10.1134/1.1261725

Citations and references

Cited by 03 references

Metrics — AkademScholar