Study of the growth of YBa2Cu3O7−x films on a Al2O3 single crystal with a CeO2 buffer sublayer
V. V. AfrosimovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgE. K. Gol’manA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgR. N. Il’inA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgM. N. PanovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgD. A. PlotkinA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgS. V. RazumovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgВ. И. СахаровA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgI. T. SerenkovSt. PetersburgA. V. Tumarkin
ABI
Abstract
Superconducting YBa2Cu3O7−x films were prepared by magnetron sputtering on Al2O3 single crystals with a CeO2 sublayer. Scattering of moderate-energy ions and x-ray diffraction were used to show that the films exhibit good single-crystal properties over the entire thickness up to 2.6 μm. The hypothesis is advanced that the indentations formed by the growth of films above “extraneous” phase grains may act as defect sinks.
Topics
Identifiers
Citations and references
Cited by 05 references