MEASUREMENT OF SOFT X-RAY MULTILAYER MIRROR REFLECTANCE
Gu Yuqiu,LI Yu tong,CHUNYU Shu tai,YOU Yong lu,and ZHANG Qiren National Key Lab of Laser Fusion, Institute of Nuclear Physics and Chemistry, CAEP, Mianyang 621900
2000en
ABI
Abstract
Laser produced line plasmas were used as a broadband source of soft X rays and a stigmatic grazing incidence grating spectrometer to measure the normal incidence reflectance of concave multilayer mirrors in the 20～40 nm spectral region. The measurements of the reflectance made on a C/Al multilayer show a little lower than the calculated results and indicate a normal incidence peak reflectance of about 22% at 28.5 nm.
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