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X-RAY MEASUREMENT OF ICF TARGET USING SURFACE PROFILER SCANNING

Yuan Liuqiong, LUO Qing, WANG Ming da Institute of Nuclear Physics and Chemistry, CAEP, P
High Power Laser and Particle Beamsjournal2000en
ABI

Abstract

The X ray radiography technique for measurement of ICF targets. Record film images of microspheres using contact microradiography. Analysis the X ray images using surface profiler, direct measuring the wall thickness of single wall microsphere. Comparsed this measurement with the optical interferometric measurement and found measurement differences 0.3μm.

Topics

Optical measurement and interference techniquesMedical Imaging Techniques and ApplicationsOptical Systems and Laser Technology

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