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Semiconductor Fatigue-Damage Indicator

М. К. КарабаевTashkent State Medical Institute, Tashkent, UzbekistanK. É. OnarkulovFergana State University, Fergana, UzbekistanM. M. AkhmedovFergana State University, Fergana, UzbekistanD. A. YusupovaFergana State University, Fergana, Uzbekistan
Journal of Engineering Physics and Thermophysicsjournal2002en
ABI

Abstract

No abstract available.

Topics

Material Properties and ApplicationsEngineering Diagnostics and ReliabilityPolymer Science and Applications

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DOI
10.1023/a:1021148515440

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Cited by 00 references
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