Article

Generation of X-ray beams by photons and relativistic electrons on crystals under the Bragg condition

Y.N. AdischevNuclear Physics Institute, Tomsk Polytechnic University, TomskS.I. ArischevNuclear Physics Institute, Tomsk Polytechnic University, TomskИ. Е. ВнуковNuclear Physics Institute, Tomsk Polytechnic University, TomskA. V. VukolovNuclear Physics Institute, Tomsk Polytechnic University, TomskV. N. ZabaevNuclear Physics Institute, Tomsk Polytechnic University, TomskB. N. KalininNuclear Physics Institute, Tomsk Polytechnic University, TomskV. V. KaplinNuclear Physics Institute, Tomsk Polytechnic University, TomskYu.P. KunashenkoNuclear Physics Institute, Tomsk Polytechnic University, TomskН. Н. НасоновBelgorod State University, Belgorod, RussiaA.P. PotylytsynNuclear Physics Institute, Tomsk Polytechnic University, TomskS. R. UglovNuclear Physics Institute, Tomsk Polytechnic University, TomskУ. С. СалихбаевNuclear Physics Laboratory, Samarkand State University, UzbekistanA. N. SafarovNuclear Physics Laboratory, Samarkand State University, UzbekistanV. I. SkripnikSamarkand State UniversityI. KhakberdievNuclear Physics Laboratory, Samarkand State University, UzbekistanAlisher YusupovNuclear Physics Laboratory, Samarkand State University, Uzbekistan

2002en

ABI

Abstract

The parametric x-ray (PXR) photon yield from single-crystal tungsten was studied in the Bragg geometry in an experiment on the SIRIUS synchrotron in Tomsk using an e-beam with the energy E=500 MeV. The tungsten crystal thickness was 1.7 mm and the surface mosaicity - not more than 1.5'. The crystal was aligned as [111] with the Bragg angle /spl theta//sub B/=45/spl deg/ to the e-beam direction. The photons were detected at 2/spl theta//sub B/=90/spl deg/ with respect to the e-beam. The angular PXR distributions were compared with the calculations including the real experimental conditions. The experimental setup for measurement diffraction of bremstrahlung of electrons in the silicon crystal is described. The arrangement is based on the microtrone MT-22, with electron beam energy 13 MeV and 22 MeV.

Topics

Crystallography and Radiation Phenomena Advanced X-ray Imaging Techniques X-ray Spectroscopy and Fluorescence Analysis

Identifiers

DOI: 10.1109/korus.2001.975125

Citations and references

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