Skip to main content
AkademIndex

Services

← Back to work

Works cited by this work

17 works

Work: Characterization of deep defects in CdxHg1 xTe by injection-level spectroscopy of carrier lifetime

  1. Untitled

    Other4 citations
    ABI

  2. Untitled

    Other3 citations
    ABI

  3. Untitled

    Other3 citations
    ABI

  4. Mechanisms for the anomalous dependence of carrier lifetime on injection level and photoconductance on light intensity

    Smagul Karazhanov

    Article20013 citations
    ABI

  5. Untitled

    Other3 citations
    ABI

  6. Untitled

    Other2 citations
    ABI

  7. Untitled

    Other1 citations
    ABI

  8. Methods for determining deep defect concentration from dependence of excess carrier density and lifetime on illumination intensity

    Smagul Karazhanov

    Article20011 citations
    ABI

  9. Untitled

    Other1 citations
    ABI

  10. Untitled

    Other1 citations
    ABI

  11. Untitled

    Other1 citations
    ABI

  12. Untitled

    Other1 citations
    ABI

  13. Untitled

    Other1 citations
    ABI

  14. Untitled

    Other1 citations
    ABI

  15. Untitled

    Other1 citations
    ABI

  16. Untitled

    Other1 citations
    ABI

  17. Untitled

    Other1 citations
    ABI