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Work: X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

  1. Micropipe evolution in silicon carbide

    M. Yu. Gutkin, A. G. Sheĭnerman, T. S. Argunova +5

    Article20032 citations
    ABI
  2. Untitled

    Other1 citations
    ABI
  3. Untitled

    Other1 citations
    ABI
  4. Untitled

    Other1 citations
    ABI