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Work: Application of RZ-scan technique for investigation of nonlinear refraction of sapphire doped with Ag, Cu, and Au nanoparticles

  1. Atomic force microscopy of Au implanted in sapphire

    D. O. Henderson, Ruojun Mu, Y. S. Tung +6

    Article19952 citations
    ABI
  2. Untitled

    Other1 citations
    ABI