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Article

Application of X-ray fluorescence for the analysis of some technological materials

N. M. MukhamedshinaInstitute of Nuclear Physics, Ulugbek, Tashkent 702132, Uzbekistan. [email protected]A. A. MirsagatovaInstitute of Nuclear Physics, Ulugbek, Tashkent 702132, Uzbekistan
Applied Radiation and Isotopesjournal2005en
ABI

Abstract

No abstract available.

Topics

Nuclear Physics and ApplicationsX-ray Spectroscopy and Fluorescence AnalysisX-ray Diffraction in Crystallography

Identifiers

DOI
10.1016/j.apradiso.2005.05.034

Citations and references

Cited by 03 references
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