Skip to main content
← Back to work

Works cited by this work

18 works

Work: Characterizations of new ΔE detectors for single-ion hit facility

  1. Semiconductor Devices: Physics and Technology

    Simon M. Sze

    Book19853 citations
    ABI
  2. An off-axis STIM procedure for precise mass determination and imaging

    Jan Pallon, Vaida Auzelyte, M. Elfman +6

    Article20042 citations
    ABI
  3. Untitled

    Other1 citations
    ABI
  4. Untitled

    Other1 citations
    ABI
  5. Untitled

    Other1 citations
    ABI
  6. Untitled

    Other1 citations
    ABI
  7. Untitled

    Other1 citations
    ABI
  8. Untitled

    Other1 citations
    ABI
  9. Untitled

    Other1 citations
    ABI
  10. Untitled

    Other1 citations
    ABI
  11. Untitled

    Other1 citations
    ABI
  12. Untitled

    Other1 citations
    ABI
  13. Untitled

    Other1 citations
    ABI
  14. Untitled

    Other1 citations
    ABI
  15. Untitled

    Other1 citations
    ABI
  16. Untitled

    Other1 citations
    ABI
  17. Untitled

    Other1 citations
    ABI
  18. Untitled

    Other1 citations
    ABI