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Works cited by this work

10 works

Work: Simulation of Random Telegraph Noise in Nanometer nMOSFET Induced by Interface and Oxide Trapped Charge

  1. Ultralow-Power Design in Near-Threshold Region

    Dejan Marković, C.C. Wang, Louis P. Alarcón +2

    Article20102 citations
    ABI
  2. RTS amplitudes in decananometer MOSFETs: 3-D simulation study

    Asen Asenov, R. Balasubramaniam, A. R. Brown +1

    Article20032 citations
    ABI
  3. Untitled

    Other1 citations
    ABI
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    Other1 citations
    ABI
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    Other1 citations
    ABI
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    Other1 citations
    ABI
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    Other1 citations
    ABI
  8. Untitled

    Other1 citations
    ABI