X-Ray fluorescence analysis of Ge–As–Se glasses using X-Ray and electron-beam excitation
G. A. BordovskyGertsen State Pedagogical University, nab. Moiki 48, St. Petersburg, 191186, RussiaА. В. МарченкоGertsen State Pedagogical University, nab. Moiki 48, St. Petersburg, 191186, RussiaП. П. СерегинGertsen State Pedagogical University, nab. Moiki 48, St. Petersburg, 191186, RussiaК. У. БобохужаевUlugbek National University of Uzbekistan, Vuzgorodok, Tashkent, 700095, Uzbekistan
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Abstract
The quantitative content of germanium, arsenic, and selenium in As1–x Se x , Ge1–x Se x , and Ge1–x–y As y Se x (As y (Ge1–z Se z )1–y ) glassy alloys has been determined by X-ray fluorescence analysis with fluorescence excitation by bremsstrahlung X-rays and an electron beam. The use of these techniques has made it possible to determine the quantitative composition of the glasses (x, y, and z) with an accuracy of ±0.0002 in a surface layer 0.1 mm (under X-ray excitation) to 0.1 μm (under electron beam excitation) in thickness.
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