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Study of polycrystalline CdTe films by contact and contactless pulsed photo-ionization spectroscopy

E. GaubasInstitute of Photonics and Nanotechnology, Vilnius University, Sauletekio av. 3, LT-10257 Vilnius, LithuaniaT. ČeponisInstitute of Photonics and Nanotechnology, Vilnius University, Sauletekio av. 3, LT-10257 Vilnius, LithuaniaD. DobrovolskasInstitute of Photonics and Nanotechnology, Vilnius University, Sauletekio av. 3, LT-10257 Vilnius, LithuaniaJ. MickevičiusInstitute of Photonics and Nanotechnology, Vilnius University, Sauletekio av. 3, LT-10257 Vilnius, LithuaniaJulius PavlovInstitute of Photonics and Nanotechnology, Vilnius University, Sauletekio av. 3, LT-10257 Vilnius, LithuaniaVytautas RumbauskasInstitute of Photonics and Nanotechnology, Vilnius University, Sauletekio av. 3, LT-10257 Vilnius, LithuaniaJ. VaitkusInstitute of Photonics and Nanotechnology, Vilnius University, Sauletekio av. 3, LT-10257 Vilnius, LithuaniaNodir AlimovFergana State University, Murabbiylar str. 19, 150100 Fergana, UzbekistanSardorbek OtajonovFergana State University, Murabbiylar str. 19, 150100 Fergana, Uzbekistan
Thin Solid Filmsjournal2018en
ABI

Abstract

No abstract available.

Topics

Chalcogenide Semiconductor Thin FilmsAdvanced Semiconductor Detectors and MaterialsThermography and Photoacoustic Techniques

Identifiers

DOI
10.1016/j.tsf.2018.06.016

Citations and references

Cited by 418 references
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