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Works citing this work

6 works

Work: Angular Distributions of Scattered Ne and Ar Ions at the Grazing Incidence on the InGaP (001) 110 Surface

  1. Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    ArticleIon-surface interactions and analysisSilicon202111 citations
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  2. Formation of defects on the surface of LiF crystals under irradiation with different ions mass

    Utkirjon Sharopov, Umid Gopparov, K. Yu. Rashidov +8

    ArticleIon-surface interactions and analysisRadiation effects and defects in solids20229 citations
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  3. Investigation of Defect InP(001) Surface by Low Energy Ion Scаttering Spectroscopy

    М. K. Kаrimov, F.O. Kuryozov, Sh.R. Sadullaev +2

    ArticleIntegrated Circuits and Semiconductor Failure AnalysisMaterials science forum20228 citations
    ABI

  4. Influence of the irradiation of ions of different mass on the formation of surface defects of lithium fluoride thin films

    Utkirjon Sharopov, Kulwinder Kaur, М. К. Курбанов +5

    ArticleIon-surface interactions and analysisSurface and Interface Analysis20226 citations
    ABI

  5. Analysis of InGaP(001) surface by the low energy ion scattering spectroscopy

    Uchkun Kutliev, М. K. Kаrimov, F.O. Kuryozov +1

    ArticleIon-surface interactions and analysisJournal of Physics Conference Series20214 citations
    ABI

  6. Controlling the Low-Temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    PreprintSemiconductor materials and devicesResearch Square20211 citations
    ABI