Machine learning-based defect prediction model using multilayer perceptron algorithm for escalating the reliability of the software
Sapna JunejaAli NaumanDepartment of Information and Communication Engineering, Yeungnam University, Gyeongsan-Si, Republic of KoreaMudita UppalInstitute of Engineering and Technology, Chitkara University, Punjab, IndiaDeepali GuptaInstitute of Engineering and Technology, Chitkara University, Punjab, IndiaRoobaea AlroobaeaDepartment of Computer Science, College of Computers and Information Technology, Taif University, P. O. Box 11099, 21944, Taif, Saudi ArabiaBahodir MuminovDepartment of Artificial Intelligence, Tashkent State University of Economics, 100066, Tashkent, UzbekistanYuning TaoSchool of Electric Power, South China University of Technology, Guangzhou, China
ABI
Abstract
No abstract available.