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Dielectric constants and double-layer formation in a perovskite thin film revealed by electrochemical impedance spectroscopy

Sauraj JhaDepartment of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, SCI 10, Richardson, TX, 75080-3021, USARoss HaroldsonDepartment of Physics, The University of Texas at Dallas, 800 West Campbell Road, SCI 10, Richardson, TX, 75080-3021, USAAnvar ZakhidovDepartment of Materials Science and Engineering, The University of Texas at Dallas, 800 West Campbell Road, SCI 10, Richardson, TX, 75080-3021, USAJason D. SlinkerDepartment of Chemistry, The University of Texas at Dallas, 800 West Campbell Road, SCI 10, Richardson, TX, 75080-3021, USA
MRS Communicationsjournal2023en
ABI

Abstract

No abstract available.

Topics

Perovskite Materials and ApplicationsConducting polymers and applicationsSolid-state spectroscopy and crystallography

Identifiers

DOI
10.1557/s43579-023-00495-3

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Cited by 030 references
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