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Works cited by this work

11 works

Work: Temperature Dependences of the Sputtering of Negative Silicon Cluster Ions

  1. Secondary-ion emission probability in sputtering

    Jens K. Nørskov, Bengt I. Lundqvist

    Article19796 citations
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  2. Clusters sputtered from tungsten

    G. Staudenmaier

    Article19725 citations
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  3. A model calculation of the neutral molecule emission by sputtering processes

    W. Gerhard

    Article19753 citations
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  4. On the mechanism of cluster emission in sputtering

    K. Wittmaack

    Article19793 citations
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  5. Энергетический порог атомарного и кластерного распыления некоторых элементов при бомбардировке ионами Cs, Rb, Na

    Р. Джаббарганов, Б. Г. Атабаев, З. А. Исаханов +1

    Article20193 citations
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  6. Энергетическая и температурная зависимость вторичной ионной эмиссии кластеров GaN/SiC при бомбардировке ионами цезия

    Б.Г. Атабаев, Р. Джаббарганов, М. Х. Ахмаджонова +1

    Article20213 citations
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  7. Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

    A. Benninghoven

    Article19732 citations
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  8. Emission mechanisms of titanium oxide ions during sputtering

    Ming L. Yu

    Article19812 citations
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  9. Secondary ion yield variations due to cesium implantation in silicon

    K. Wittmaack

    Article19832 citations
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  10. Untitled

    Other1 citations
    ABI

  11. Untitled

    Other1 citations
    ABI