Formation and Properties of Injecting Contacts Based on Molybdenum Oxide Films for Organic Electronic Devices
А. S. KomolovSt. Petersburg State University, 199034, St. Petersburg, RussiaЕ. А. ДубовSt. Petersburg State University, 199034, St. Petersburg, RussiaM. UbovichSt. Petersburg State University, 199034, St. Petersburg, RussiaA. A. KomolovaSt. Petersburg State University, 199034, St. Petersburg, RussiaЭ. Ф. ЛазневаSt. Petersburg State University, 199034, St. Petersburg, RussiaВ. С. СоболевSt. Petersburg State University, 199034, St. Petersburg, RussiaИ. А. ПронинPenza State University, 440026, Penza, RussiaS. A. PshenichnyukInstitute of Molecule and Crystal Physics, Ufa Federal Research Center, Russian Academy of Sciences, 450054, Ufa, RussiaFeruza AkbarovaInstitute of Materials Science, NPO Fizika-Solntse, Uzbekistan Academy of Sciences, 100084, Tashkent, UzbekistanUtkirjon SharopovBukhara State University, 200118, Bukhara, Uzbekistan
ABI
Abstract
The atomic composition, work function, and structural properties of thin (10–150 nm) MoO3 films obtained by magnetron sputtering were studied by X-ray and ultraviolet photoelectron spectroscopy, X‑ray powder diffraction analysis, and atomic force microscopy.