Article

Structural, morphological, optical, and electrical properties of SbxSey films with different compositions grown by Chemical-molecular beam deposition method from Separate Sb and Se precursors

T.M. RazykovPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanK.M. KouchkarovPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanB. A. ErgashevPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanР. ХуррамовPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanD. Z. IsakovPhysical-Technical Institute, Chingiz Aytmatov Street 2B, 100084, Tashkent, UzbekistanМ. С. ТивановFaculty of Physics, Belarusian State University, Nezavisimosti Ave. 4, 220030, Minsk, Belarus

Journal of Materials Science Materials in Electronicsjournal2025en

ABI

Abstract

No abstract available.

Topics

Chalcogenide Semiconductor Thin Films Phase-change materials and chalcogenides Solid-state spectroscopy and crystallography

Identifiers

DOI: 10.1007/s10854-025-16307-4

Citations and references

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