Benchmarking YOLO nano-architectures for real-time thermal imaging: application to okra maturity grading on heterogeneous computing platforms
Madasamy Raja GanapathyPathmanaban PugazhendiDepartment of Automobile Engineering, Easwari Engineering College, Chennai, Tamil Nadu, 600089, IndiaSelvaraju PeriasamyBasker NagarajanDepartment of Information Technology, Sona College of Technology, Salem, Tamil Nadu, 636004, India
ABI
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