Single-shot near-field reconstruction of metamaterial dispersion
Abstract
We present a single-shot near-field technique, where the near-field scan is performed on a single sample without repeating measurements or averaging over multiple samples, to reconstruct the isofrequency surfaces of metamaterials in the microwave regime. In our approach, we excite resonant modes using a fixed source in a resonator composed of the material under test and map the in-plane field distribution with a movable probe. Applying a fast Fourier transform (FFT) to the measured field reveals the sample's in-plane dispersion. By extending this analysis over multiple frequencies and comparing the results with Fabry-Pérot resonances, we retrieve the full three-dimensional dispersion relation. When we apply the method to a double non-connected wire metamaterial, it accurately captures the low-frequency hyperbolic isofrequency surface, providing both a precise experimental tool and conceptual insight into spatially dispersive metamaterials.