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Development of Zn1−xSnxO and Mg1−xSnxO transparent conducting oxide thin films for perovskite solar cell applications

G. KiruthigaDepartment of Science and Humanities (Physics), FOE, Karpagam Academy of Higher Education, Coimbatore, Tamil Nadu, 641 021, IndiaM. Sathish KumarCentre for Smart Energy Systems, Chennai Institute of Technology, Chennai, Tamil Nadu, 600069, IndiaT. RaguramLaboratory of Physical Chemistry and Solid-State Electrochemistry (LFES), Department of Materials Chemistry, Faculty of Chemistry and Biology, University of Santiago de Chile (USACH), Santiago, ChileArun Prasad MuraliDepartment of Mechanical Engineering, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai, IndiaChandini RagumoorthyDepartment of Chemical Engineering and Biotechnology, National Taipei University of Technology, Taipei, TaiwanRakesh KumarDepartment of Mechanical Engineering, Manipal University Jaipur, Jaipur, Rajasthan, 303007, India. [email protected]Jayant GiriCentre for Research Impact and Outcome, Chitkara University Institute of Engineering and Technology, Chitkara University, Rajpura, Punjab, 140401, IndiaFaruq MohammadDepartment of Chemistry, College of Science, King Saud University, P.O. Box 2455, 11451, Riyadh, Kingdom of Saudi ArabiaAhmed A. SoleimanDepartment of Biology and Chemistry, College of Sciences and Engineering, Southern University, Baton Rouge, LA, 70813, USAIslom KadirovDepartment of Transport Systems, Urgench State University, 220100, Urgench, Uzbekistan
Scientific Reportsjournal2026en
ABI

Abstract

Abstract Zinc-doped tin oxide (ZTO) and magnesium-doped tin oxide (MTO) transparent conducting oxide (TCO) thin films were synthesized using the atomizer spray pyrolysis method and annealed at 450 °C for application as front electrodes in perovskite solar cells (PSCs). The precursor molar ratio was varied from 0.1:0.1 to 0.1:0.5 (Zn/Mg:Sn), resulting in film thicknesses ranging from 210 to 513 nm for ZTO and 243 to 688 nm for MTO after annealing. X-ray diffraction analysis confirmed improved crystallinity with increased crystallite size after annealing. Optical studies revealed high transmittance of ~ 76–80% in the visible region. The optical bandgap decreased after annealing, from 3.85 to 3.67 eV for ZTO and from 3.82 to 3.40 eV for MTO. Hall effect measurements confirmed n-type conductivity with enhanced electrical performance at higher molar concentrations. The optimized MTO film exhibited a maximum carrier concentration of 2.78 × 10 20 cm −3 , mobility of 31.56 cm 2 /V s, and low resistivity of 1.89 × 10 −4 Ω cm. Photovoltaic devices fabricated using annealed ZTO and MTO substrates achieved power conversion efficiencies of 3.45% and 6.38%, respectively. The improved device performance of MTO-based PSCs is attributed to its higher conductivity and optical transparency, demonstrating its potential as an alternative cost-effective TCO material for solar cell applications.

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