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SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE

U.T. AsatovTashkent Institute of Chemical TechnologyN.Kh. UlugmuradovTashkent Institute of Chemical TechnologySh.N. BuribaevTashkent Institute of Chemical Technology
Zenodo (CERN European Organization for Nuclear Research)repository2026
ABI

Abstract

In the present work, the dependence of the saturation thickness of the scattered gamma radiation on the detection angles and the orientation of flat targets relative to the direction of the probing beam was observed for the first time.

Topics

Radiation Detection and Scintillator TechnologiesCrystallography and Radiation PhenomenaParticle Detector Development and Performance

Identifiers

DOI
10.5281/zenodo.20095887

Citations and references

Cited by 00 references
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