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Work: Investigation of electron irradiation effects on defect states in silicon using Raman and infrared spectroscopy methods

  1. Raman spectroscopy of PtSi formation at the Pt/Si(100) interface

    J. C. Tsang, Y. Yokota, R. Matz +1

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  2. One and two-phonon Raman scattering from nanostructured silicon

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  3. Raman shifts in Si nanocrystals

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    Other4 citations
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  5. Initial Phase formation at the Interface of Ni, Pd, or Pt and Si

    R. J. Nemanich, Chia-Lun Tsai, B. Stafford +2

    Article19833 citations
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