Attention embedded residual CNN for disease detection in tomato leaves
R. KarthikSchool of Electronics Engineering, Vellore Institute of Technology, Chennai, IndiaM. HariharanSchool of Computing sciences and Engineering, Vellore Institute of Technology, Chennai, IndiaSundar AnandSchool of Electronics Engineering, Vellore Institute of Technology, Chennai, IndiaPriyanka MathiksharaSchool of Electronics Engineering, Vellore Institute of Technology, Chennai, IndiaAnnie JohnsonSchool of Electronics Engineering, Vellore Institute of Technology, Chennai, IndiaR. MenakaSchool of Electronics Engineering, Vellore Institute of Technology, Chennai, India
2019en
ABI
Abstract
No abstract available.
Identifiers
Citations and references
Cited by 20 references