Works citing this work

2 works

Work: Reflection z‐scan measurements of opaque semiconductor thin films

1. Application of RZ-scan technique for investigation of nonlinear refraction of sapphire doped with Ag, Cu, and Au nanoparticles

   R. A. Ganeev, A.I. Ryasnyansky, А. Л. Степанов +3

   ArticleNonlinear Optical Materials StudiesOptics Communications20058 citations

   ABIABI:AkademIndex/openalex/2005.article.000024

2. Single-shot reflection Z-scan for measurements of the nonlinear refraction of nontransparent materials

   R. A. Ganeev

   ArticleNonlinear Optical Materials StudiesApplied Physics B20082 citations

   ABIABI:AkademIndex/openalex/2008.article.000067