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Works cited by this work

18 works

Work: Reflection z‐scan measurements of opaque semiconductor thin films

  1. Untitled

    Other1117 citations
    ABI

  2. Sensitive measurement of optical nonlinearities using a single beam

    Mansoor Sheik‐Bahae, A. A. Said, Tai‐Huei Wei +2

    Article1990100 citations
    ABI

  3. Theoretical study on the closed-aperture Z-scan curves in the materials with nonlinear refraction and strong nonlinear absorption

    Xiaodong Li, Shengli Guo, Hui‐Tian Wang +1

    Article200132 citations
    ABI

  4. Investigation of nonlinear refraction and nonlinear absorption of semiconductor nanoparticle solutions prepared by laser ablation

    R. A. Ganeev, A.I. Ryasnyansky, R. I. Tugushev +1

    Article200317 citations
    ABI

  5. Dispersion of bound electron nonlinear refraction in solids

    Mansoor Sheik‐Bahae, D. C. Hutchings, David J. Hagan +1

    Article199113 citations
    ABI

  6. Optical nonlinearities and photo-excited carrier lifetime in CdS at 532 nm

    H.P Li, C. H. Kam, Yee Loy Lam +1

    Article200112 citations
    ABI

  7. Eclipsing Z-scan measurement of λ/10^4 wave-front distortion

    T. Xia, David J. Hagan, Mansoor Sheik‐Bahae +1

    Article199411 citations
    ABI

  8. Nonlinear refraction in CS2

    R. A. Ganeev, A.I. Ryasnyansky, M. Baba +5

    ArticleNonlinear Optical Materials StudiesApplied Physics B20049 citations
    ABI

  9. Measurement of nonlinear refractive index by time-resolved z-scan technique

    Tadashi Kawazoe, Hitoshi Kawaguchi, Jun Inoue +2

    Article19999 citations
    ABI

  10. Reflection <i>Z</i>-scan technique for measurements of optical properties of surfaces

    Д. В. Петров, Alex Sandro Gomes, Cid B. de Araújo

    Article19949 citations
    ABI

  11. Measurements of nondegenerate optical nonlinearity using a two-color single beam method

    H. Ma, Anderson S. L. Gomes, Cid B. de Araújo

    Article19918 citations
    ABI

  12. Measurement of refractive nonlinearities in GaAs above bandgap energy

    Marcelo Martinelli, Laércio Gomes, R. J. Horowicz

    Article20007 citations
    ABI

  13. Variations of nonlinear optical characteristics of C60 thin films at 532 nm

    R. A. Ganeev, A.I. Ryasnyansky, В. И. Редкоречев +3

    ArticleNonlinear Optical Materials StudiesOptics Communications20036 citations
    ABI

  14. Measurement of refractive-index change at a liquid–solid interface close to the critical angle

    M. Martinelli, Marcos Gugliotti, R. J. Horowicz

    Article20005 citations
    ABI

  15. Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

    M. Martinelli, S. Bian, J. R. Leite +1

    Article19985 citations
    ABI

  16. Reflection of a Gaussian beam from a saturable absorber

    Д. В. Петров, Anderson S. L. Gomes, Cid B. de Araújo

    Article19963 citations
    ABI

  17. Optical properties of amorphous multilayers

    H. Hamanaka, Satoshi Konagai, K. Murayama +2

    Article19963 citations
    ABI

  18. Untitled

    Other1 citations
    ABI