On the use of SRIM for computing radiation damage exposure
R.E. StollerMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, United StatesM.B. ToloczkoPacific Northwest Laboratory Richland, WA, United StatesGary S. WasNuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI, United StatesA. CertainPacific Northwest Laboratory Richland, WA, United StatesShyam DwaraknathNuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI, United StatesF.А. Garner
2013en
ABI
Abstract
No abstract available.
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Cited by 30 references