Book

Scanning Electron Microscopy and X-Ray Microanalysis

Joseph I. GoldsteinUniversity of Massachusetts, Amherst, USADale E. NewburyNational Institute of Standards and Technology, Gaithersburg, USAJoseph R. MichaelSandia National Laboratories, Albuquerque, USANicholas W. M. RitchieNational Institute of Standards and Technology, Gaithersburg, USAJohn Henry J. ScottNational Institute of Standards and Technology, Gaithersburg, USADavid C. JoyUniversity of Tennessee, Knoxville, USA

2017en

ABI

Abstract

No abstract available.

Identifiers

DOI: 10.1007/978-1-4939-6676-9

Citations and references

Cited by 30 references

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