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Crystal Growth of the Perovskite Semiconductor CsPbBr<sub>3</sub>: A New Material for High-Energy Radiation Detection

Constantinos C. StoumposMaterials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, United StatesChristos D. MalliakasMaterials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, United StatesJohn A. PetersNorthwestern University****Zhifu LiuNorthwestern University****Maria SebastianNorthwestern University****Jino ImNorthwestern University****Thomas C. ChasapisNorthwestern University****Arief C. WibowoMaterials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, United StatesDuck Young ChungMaterials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, United StatesA. J. FreemanNorthwestern University****Bruce W. WesselsNorthwestern University****Mercouri G. KanatzidisMaterials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, United States
2013en
ABI

Abstract

The synthesis, crystal growth, and structural and optoelectronic characterization has been carried out for the perovskite compound CsPbBr3. This compound is a direct band gap semiconductor which meets most of the requirements for successful detection of X- and γ-ray radiation, such as high attenuation, high resistivity, and significant photoconductivity response, with detector resolution comparable to that of commercial, state-of-the-art materials. A structural phase transition which occurs during crystal growth at higher temperature does not seem to affect its crystal quality. Its μτ product for both hole and electron carriers is approximately equal. The μτ product for electrons is comparable to cadmium zinc telluride (CZT) and that for holes is 10 times higher than CZT.

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