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Dark current-voltage measurements on photovoltaic modules as a diagnostic or manufacturing tool

David L. KingSandia National Laboratories, Albuquerque, NM, USAB.R. HansenSandia National Laboratories, Albuquerque, NM, USAJ.A. KratochvilSandia National Laboratories, Albuquerque, NM, USAMichael A. QuintanaSandia National Laboratories, Albuquerque, NM, USA
2002en
ABI

Abstract

Dark current-voltage (dark I-V) measurements are commonly used to analyze the electrical characteristics of solar cells, providing an effective way to determine fundamental performance parameters without the need for a solar simulator. The dark I-V measurement procedure does not provide information regarding short-circuit current, but is more sensitive than light I-V measurements in determining the other parameters (series resistance, shunt resistance, diode factor and diode saturation currents) that dictate the electrical performance of a photovoltaic device. The work documented here extends the use of dark I-V measurements to photovoltaic modules, illustrates their use in diagnosing module performance losses and proposes their use for process monitoring during manufacturing.

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Cited by 20 references