Methods for measuring parameters of semiconductor materials
Diana E. TuzovaPenza State University, 40 Krasnaya Street, Penza, RussiaEkaterina A. PecherskayaPenza State University, 40 Krasnaya Street, Penza, RussiaMikhail A. NelyutskovPenza State University, 40 Krasnaya Street, Penza, RussiaVladimir V. AntipenkoPenza State University, 40 Krasnaya Street, Penza, Russia
2023en
ABI
Abstract
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Cited by 40 references