Oxycarbide MXenes and MAX phases identification using monoatomic layer-by-layer analysis with ultralow-energy secondary-ion mass spectrometry
Paweł Piotr MichałowskiŁukasiewicz Research Network-Institute of Microelectronics and Photonics, Warsaw, Poland. [email protected]Mark AnayeeA. J. Drexel Nanomaterials Institute and Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, USATyler S. MathisA. J. Drexel Nanomaterials Institute and Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, USASylwia KozdraŁukasiewicz Research Network-Institute of Microelectronics and Photonics, Warsaw, PolandAdrianna WójcikFaculty of Physics, Warsaw University of Technology, Warsaw, PolandKanit HantanasirisakulA. J. Drexel Nanomaterials Institute and Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, USAI. JóźwikŁukasiewicz Research Network-Institute of Microelectronics and Photonics, Warsaw, PolandAnna PiątkowskaŁukasiewicz Research Network-Institute of Microelectronics and Photonics, Warsaw, PolandM. MożdżonekŁukasiewicz Research Network-Institute of Microelectronics and Photonics, Warsaw, PolandA. MalinowskaŁukasiewicz Research Network-Institute of Microelectronics and Photonics, Warsaw, PolandRyszard DiduszkoŁukasiewicz Research Network-Institute of Microelectronics and Photonics, Warsaw, PolandEdyta WierzbickaŁukasiewicz Research Network-Institute of Microelectronics and Photonics, Warsaw, PolandYury GogotsiA. J. Drexel Nanomaterials Institute and Department of Materials Science and Engineering, Drexel University, Philadelphia, PA, USA. [email protected]
2022en
ABI
Abstract
No abstract available.
Identifiers
Citations and references
Cited by 20 references