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Nanocrystallization of amorphous M-Si thin film composites (M=Cr, Mn) and their thermoelectric properties

А. Т. БурковA.F. Ioffe Physical-Technical Institute, Sankt-Petersburg, 194021, RussiaS. V. NovikovA.F. Ioffe Physical-Technical Institute, Sankt-Petersburg, 194021, RussiaJ. SchumannLeibniz Institute for Solid State and Materials Research, Dresden, Germany
2012en
ABI

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Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation A. T. Burkov, S. V. Novikov, J. Schumann; Nanocrystallization of amorphous M-Si thin film composites (M=Cr, Mn) and their thermoelectric properties. AIP Conf. Proc. 26 June 2012; 1449 (1): 219–222. https://doi.org/10.1063/1.4731536 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search

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Cited by 20 references