Raman and XPS characterization of vanadium oxide thin films with temperature
Ferran Ureña-BegaraUniversité catholique de Louvain, Institute of Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Louvain-la-Neuve, BelgiumAurélian CrunteanuXLIM Research Institute, UMR 7252, CNRS/Université de Limoges, Limoges, FranceJean‐Pierre RaskinUniversité catholique de Louvain, Institute of Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Louvain-la-Neuve, Belgium
2017en
ABI
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Cited by 30 references