ArticleFundamentals of surface and thin film analysisL. C. Feldman·James W. Mayer·M. Grasserbauer·1987·enABIABI:AkademIndex/openalex/2026.other.382140CiteAbstractNo abstract available.IdentifiersDOI10.1016/s0003-2670(00)82855-xCitations and referencesCited by 20 referencesMetrics — AkademScholar