Reduction of self-heating effect using selective buried oxide (SELBOX) charge plasma based junctionless transistor
Amrish KumarDepartment of Electronics & Communication Engineering, Motilal Nehru National Institute of Technology, Allahabad 211004, IndiaAbhinav GuptaSanjeev RaiDepartment of Electronics & Communication Engineering, Motilal Nehru National Institute of Technology, Allahabad 211004, India
2018en
ABI
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Cited by 20 references