RESEARCH OF THEORETICAL MODEL OF FAILURES OF THE MICROELECTRONICBLOCK НСС

Abstract

The issues of researching the model of failures developed by the microelectronic block, which controls paired arrows, obtaining the numerical value of the operational intensity of the microelectronic block failures, researching the theoretical model of failures, obtained the numerical values of the operational intensity of the microelectronic block failures are discussed in this article

Identifiers

DOI

10.26739/2181-9696-2020-6-3

Citations and references