Article

Analysis of Porous Nanosilicon by Raman Spectroscopy

V. M. RotshteynInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, UzbekistanT. K. TurdalievInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, UzbekistanХ. Б. АшуровInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, Uzbekistan

Journal of Applied Spectroscopyjournal2022en

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Abstract

No abstract available.

Topics

Silicon Nanostructures and Photoluminescence Nanowire Synthesis and Applications Semiconductor materials and devices

Identifiers

DOI: 10.1007/s10812-022-01323-7

Citations and references

Cited by 1 18 references

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