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Low-Temperature Microwave Processed TiO<sub>2</sub> as an Electron Transport Layer for Enhanced Performance and Atmospheric Stability in Planar Perovskite Solar Cells

Sudhir RanjanDepartment of Chemical Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, IndiaRahul RanjanDepartment of Chemical Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, IndiaAnkit TyagiDepartment of Chemical Engineering, Indian Institute of Technology Jammu, Jammu 181221, IndiaKewal Singh RanaSchool of Basic Sciences Indian Institute of Technology Mandi, Mandi 175005, IndiaAjay SoniSchool of Basic Sciences Indian Institute of Technology Mandi, Mandi 175005, IndiaHari Krishna KodaliSiemens Digital Industries Software, Lebanon, New Hampshire 03766, United StatesVikram L. DalalMicroelectronics Research Center, Department of Electrical and Computer Engineering, Iowa State University, Ames, Iowa 50011, United StatesAnand SinghDepartment of Chemistry, Indian Institute of Technology Kanpur, Kanpur 208016, IndiaAshish GargDepartment of Sustainable Energy Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, IndiaKanwar Singh NalwaDepartment of Sustainable Energy Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, IndiaRaju Kumar GuptaCentre for Environmental Science and Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, Uttar Pradesh, India
2022en
ABI

Abstract

Low-temperature (∼150 °C) solution processed planar perovskite solar cells (PSCs) using TiO2 as an electron transport layer (ETL) offer promise for a simple fabrication methodology and compatibility with polymeric substrates and perovskite-based tandem devices. However, the amorphous nature and presence of trap states on the low-temperature TiO2 surface hinder the effective carrier transport. Further, perovskite crystallization on ETL develops lattice strain resulting in the creation of unwanted defect centers. Herein, a low-temperature microwave processed compact TiO2 (MW-TiO2) film is reported that possesses lower surface oxygen vacancy defects and enhanced conductivity and promotes efficient electron extraction owing to the enhanced built-in potential (Vbi) at the MW-TiO2/perovskite interface. The suppressed heterogeneous nucleation of MAPbI3 crystals on the less defective MW-TiO2 surface relieves the interfacial strain, thereby making it a superior template for the growth of strain relaxed, high-quality perovskite films with a more n-type character having larger grains, resulting in suppressed interfacial/surface and bulk trap density. Further, MW-TiO2 mitigates the interfacial energetic disorder and Urbach energy owing to reduced strain, thereby boosting the open-circuit voltage (Voc) by 40 mV, while improved optoelectronic properties of MW-TiO2, lower interfacial charge transfer resistance, and high-quality perovskite films simultaneously improve the short-circuit current density (Jsc) and fill factor (FF) by 6.82 and 9.37%, respectively, over HT-TiO2 based devices. Compared to high-temperature (500 °C) annealed TiO2 based MAPbI3 planar PSCs, MW-TiO2 based devices exhibited a substantial performance enhancement of 22%, leading to the best efficiency of ∼18% and superior atmospheric stability (25 °C, 55% relative humidity) while maintaining 80% of its initial value after 2500 h. Experimental results are validated by device simulation studies with model accounting for trap-assisted interfacial and bulk recombination. Finally, MW processed flexible devices maintained over 80% of their initial power conversion efficiency (PCE) after 1000 bending cycles, thereby exhibiting excellent mechanical robustness. These results elucidate the critical role of MW-TiO2 in rendering improved performance, flexibility, and stability in low-temperature PSCs.

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