<title>Chalcogenide glass thin films: Z-Scan measurements of refractive index changes</title>
Francesco MichelottiM. BertolottiValentin N. CiumashAcademy of Sciences of Moldova, MoldovaA. M. AndrieshAcademy of Sciences of Moldova, Moldova
1993en
ABI
Abstract
Nonlinear properties of chalcogenide glass As2S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.
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